| Original language | American English |
|---|---|
| Qualification | Ph.D. |
| Awarding Institution |
|
| Supervisors/Advisors |
|
| State | Published - Jan 19 2012 |
Keywords
- Line Tension
- Slip Length
- Colloidal Probe AFM
- Atomic Force Microscopy
- AFM
Disciplines
- Physical Sciences and Mathematics
- Physics
- Condensed Matter Physics
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